IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4372 - 4373
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4700 - 4705
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4457 - 4465
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4752 - 4758
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4607 - 4614
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4561 - 4567
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4599 - 4606
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4540 - 4546
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4746 - 4751
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4442 - 4449
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4628 - 4635
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > C2
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4724 - 4730
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4664 - 4670
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4430 - 4434
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4374 - 4385
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4424 - 4429
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4686 - 4692
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399