IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1594 - 1596
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1696 - 1701
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1687 - 1695
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1728 - 1734
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1741 - 1747
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1597 - 1607
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1628 - 1634
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1752 - 1760
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1804 - 1808
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1663 - 1671
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1748 - 1751
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1649 - 1654
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1643 - 1648
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1655 - 1662
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1672 - 1680
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1702 - 1709
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1768 - 1774
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1710 - 1721
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1722 - 1727
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1809 - 1812