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Rapid advances of semiconductor technology lead to higher circuit integration as well as higher operating frequencies. The statistical variations of the parameters during the manufacturing process as well as physical defects in integrated circuits can sometimes degrade circuit performance without altering its logic functionality. These faults are called delay faults. In this paper we consider the...
In the work typical ESD failures of integrated circuits and ESD testing methods are presented. Authors describe dependencies between ESD models and different ESD failures. In order to allow more advanced ESD testing of integrated circuits, transmission line pulsing is proposed and its correlation to HBM method described. Finally conclusions based on up-to-date research and test results obtained with...
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