2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) > 169 - 172
Source
Abstract
Identifiers
book e-ISSN : | 1946-1550 |
book e-ISBN : | 978-1-4673-8259-5 , 978-1-4673-8258-8 |
DOI | 10.1109/IPFA.2016.7564273 |