Metrology and Measurement Systems
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 171-182
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 183-191
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 77-84
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 33-45
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 161-170
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 107-116
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 5-18
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 61-75
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 47-59
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 143-159
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 129-141
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 117-127
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 19-31
Metrology and Measurement Systems > 2009 > Vol. 16, nr 1 > 85-105
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 313-321
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 299-311
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 279-288
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 209-218
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 249-257
Metrology and Measurement Systems > 2009 > Vol. 16, nr 2 > 219-232