Search results for: H. Lee
IEEE Electron Device Letters > 2017 > 38 > 9 > 1224 - 1227
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-1.1 - 2D-1.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-1.1 - 2B-1.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-2.1 - 3C-2.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-4.1 - 3C-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-3.1 - 4C-3.5
Journal of Biosciences > 2017 > 42 > 1 > 131-138
2016 IEEE International Electron Devices Meeting (IEDM) > 31.7.1 - 31.7.4
2016 IEEE International Electron Devices Meeting (IEDM) > 15.2.1 - 15.2.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 4C-1-1 - 4C-1-5
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-3-1 - 4B-3-5
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-3-1 - DI-3-5
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-1-1 - 7A-1-6
Journal of Advanced Nursing > 72 > 4 > 836 - 848