Search results for: H. Kim
IEEE Journal of Solid-State Circuits > 2017 > 52 > 6 > 1655 - 1663
IEEE Journal of Solid-State Circuits > 2017 > 52 > 3 > 799 - 811
2015 IEEE International Electron Devices Meeting (IEDM) > 20.7.1 - 20.7.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 2 > 280 - 291
IEEE Micro > 2014 > 34 > 6 > 74 - 85
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.6
2012 IEEE International Reliability Physics Symposium (IRPS) > 4C.1.1 - 4C.1.8
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
IEEE Spectrum > 2011 > 48 > 5 > 28 - 33
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385