Search results for: S. Gupta
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 245 - 251
2012 International Electron Devices Meeting > 28.3.1 - 28.3.4
IEEE Electron Device Letters > 2012 > 33 > 12 > 1756 - 1758
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2809 - 2817
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2567 - 2574
IEEE Electron Device Letters > 2012 > 33 > 2 > 266 - 268
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3263 - 3268
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2936 - 2943