Search results for: Y. Watanabe
2015 IEEE International Electron Devices Meeting (IEDM) > 25.8.1 - 25.8.4
IEEE Electron Device Letters > 2011 > 32 > 3 > 237 - 239
2007 IEEE International Electron Devices Meeting > 523 - 526
2007 IEEE International Electron Devices Meeting > 341 - 344