Search results for: S. Lee
2016 IEEE International Electron Devices Meeting (IEDM) > 2.7.1 - 2.7.4
IEEE Electron Device Letters > 2011 > 32 > 4 > 440 - 442
2016 IEEE International Electron Devices Meeting (IEDM) > 2.7.1 - 2.7.4
IEEE Electron Device Letters > 2011 > 32 > 4 > 440 - 442