Search results for: Gerard Ghibaudo
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 66 - 72
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4913 - 4918
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3117 - 3124
2015 IEEE International Reliability Physics Symposium > XT.1.1 - XT.1.6
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 3 - 8
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 969 - 975
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1462 - 1467
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1891 - 1898
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2534 - 2538
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 171 - 176
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3299 - 3305
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 180 - 182
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2235 - 2248
Solid State Electronics > 2009 > 53 > 12 > 1313-1317
IEEE Electron Device Letters > 2009 > 30 > 9 > 975 - 977