Search results for: G. Groeseneken
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-5.1 - 2D-5.6
2015 IEEE International Reliability Physics Symposium > MY.4.1 - MY.4.6
2015 IEEE International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2015 IEEE International Reliability Physics Symposium > 3B.1.1 - 3B.1.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 5E.3.1 - 5E.3.7
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.5.1 - XT.5.6
2012 IEEE International Reliability Physics Symposium (IRPS) > MY.1.1 - MY.1.4
2011 International Reliability Physics Symposium > 2D.3.1 - 2D.3.6
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1490 - 1498
2010 International Electron Devices Meeting > 28.4.1 - 28.4.4
2009 31st EOS/ESD Symposium > 1 - 9
IEEE Electron Device Letters > 2009 > 30 > 12 > 1374 - 1376