Search results for: G. Groeseneken
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.5.1 - XT.5.6
2011 International Reliability Physics Symposium > 2D.3.1 - 2D.3.6
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1490 - 1498
2010 International Electron Devices Meeting > 28.4.1 - 28.4.4
IEEE Electron Device Letters > 2009 > 30 > 12 > 1374 - 1376
2009 31st EOS/ESD Symposium > 1 - 8
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430