Search results for: N Badereddine
Journal of Electronic Testing > 2014 > 30 > 5 > 611-627
2010 15th IEEE European Test Symposium > 132 - 137
Design Automation Conference > 853 - 856
Journal of Electronic Testing > 2008 > 24 > 4 > 353-364
Journal of Electronic Testing > 2014 > 30 > 5 > 611-627
2010 15th IEEE European Test Symposium > 132 - 137
Design Automation Conference > 853 - 856
Journal of Electronic Testing > 2008 > 24 > 4 > 353-364