Search results for: Juan Boon Tan
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 3 > 279 - 290
Microelectronics Reliability > 2010 > 50 > 7 > 986-994
Microelectronics Reliability > 2009 > 49 > 2 > 150-162
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 3 > 279 - 290
Microelectronics Reliability > 2010 > 50 > 7 > 986-994
Microelectronics Reliability > 2009 > 49 > 2 > 150-162