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This paper presents an efficient test framework to extend a use of low-cost ATE (Automatic Test Equipment) to at-speed test of high-speed DUT (Device Under Test). To bridge the speed gap between the ATE and the DUT, an off-chip test interface circuit, called Built-off Test Interface (BOTI), has been developed. Unlike the previous methods which use on-chip or off-chip self-test circuits, in our method,...
Skew calibration and compensation are critical ATE features for reliable functional test, particularly for applications such as memory chips. This paper presents a new time-to-digital converter (TDC) design for off-chip skew calibration from time domain reflectometry (TDR) measurements. It consists of coarse and fine parts which enable the circuit to detect a large skew range with high resolution...
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