Search results for: Guo
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2326 - 2329
IEEE Access > 2017 > 5 > 16459 - 16468
IEEE Transactions on Reliability > 2016 > 65 > 1 > 256 - 262
IEEE Electron Device Letters > 2014 > 35 > 3 > 345 - 347
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2345 - 2349