Search results for: L.W. Massengill
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 135 - 144
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 203 - 209
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2861 - 2871
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2886 - 2894
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3342 - 3346
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3114 - 3121
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3309 - 3313
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3456 - 3460
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2957 - 2961
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3440 - 3446
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3130 - 3135
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3347 - 3351
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3136 - 3140
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3336 - 3341