Search results for: Kohei Miyase
Journal of Electronic Testing > 2019 > 35 > 4 > 485-495
2010 15th IEEE European Test Symposium > 107 - 111
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2009 > 28 > 11 > 1767 - 1776
Journal of Electronic Testing > 2008 > 24 > 4 > 379-391