Search results for: C. Chen
2016 IEEE International Electron Devices Meeting (IEDM) > 11.3.1 - 11.3.4
IEEE Electron Device Letters > 2016 > 37 > 8 > 998 - 1001
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 458 - 460
IEEE Electron Device Letters > 2009 > 30 > 2 > 165 - 167
2007 IEEE International Electron Devices Meeting > 457 - 460