Search results for: C. Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-9.1 - XT-9.5
2016 IEEE International Electron Devices Meeting (IEDM) > 34.5.1 - 34.5.4
2015 IEEE International Electron Devices Meeting (IEDM) > 26.1.1 - 26.1.4
2015 IEEE International Electron Devices Meeting (IEDM) > 22.5.1 - 22.5.4
IEEE Electron Device Letters > 2011 > 32 > 12 > 1749 - 1751
2010 International Electron Devices Meeting > 19.2.1 - 19.2.4