Search results for: H. Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
IEEE Electron Device Letters > 2016 > 37 > 12 > 1642 - 1645
2016 IEEE International Electron Devices Meeting (IEDM) > 12.1.1 - 12.1.4
2016 IEEE International Electron Devices Meeting (IEDM) > 35.4.1 - 35.4.4
IEEE Electron Device Letters > 2016 > 37 > 6 > 698 - 700
2015 IEEE International Electron Devices Meeting (IEDM) > 14.4.1 - 14.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 15.1.1 - 15.1.4
2013 IEEE International Electron Devices Meeting > 2.6.1 - 2.6.4
2013 IEEE International Electron Devices Meeting > 9.1.1 - 9.1.4
IEEE Electron Device Letters > 2013 > 34 > 4 > 541 - 543
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2314 - 2320
IEEE Transactions on Industrial Electronics > 2011 > 58 > 7 > 2755 - 2771
IEEE Electron Device Letters > 2011 > 32 > 2 > 155 - 157
2010 International Electron Devices Meeting > 35.5.1 - 35.5.4
2010 International Electron Devices Meeting > 27.1.1 - 27.1.4