Search results for: C. Chen
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-4.1 - 3C-4.6
2016 IEEE International Electron Devices Meeting (IEDM) > 11.3.1 - 11.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 12.1.1 - 12.1.4
2016 IEEE International Electron Devices Meeting (IEDM) > 2.7.1 - 2.7.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 7A-1-1 - 7A-1-6
2015 IEEE International Electron Devices Meeting (IEDM) > 9.5.1 - 9.5.4
2015 IEEE International Reliability Physics Symposium > 3B.1.1 - 3B.1.6
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3111 - 3117
2013 IEEE International Electron Devices Meeting > 9.1.1 - 9.1.4
2012 International Electron Devices Meeting > 23.3.1 - 23.3.4