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We have identified at least five different kinds of local breakdown according to the temperature coefficient (TC) and slope of their characteristics and electroluminescence (EL) under a reverse bias. These are 1) early prebreakdown (negative TC, low slope), 2) edge breakdown (positive TC, low slope, no EL), 3) weak defect-induced breakdown (zero or weakly negative TC, moderate slope, 1550-nm defect...
We have identified at least five different local breakdown mechanisms according to the temperature coefficient (TC) and slope of their characteristics and electroluminescence (EL) under reverse bias. These are (1) early pre-breakdown (strongly negative TC, low slope), (2) edge breakdown (positive TC, low slope, no EL), (3) weak defect-induced breakdown (zero or weakly negative TC, moderate slope,...
We present a comprehensive overview over infrared imaging techniques for (electrical) silicon solar cell characterization. Recent method development in local series resistance imaging is reviewed in more detail and new results in local breakdown investigations on multicrystalline (mc) silicon solar cells are reported. We observe local junction breakdown sites on industrial mc-cells at reverse voltages...
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