Search results for: R. Rodriguez
2016 IEEE International Electron Devices Meeting (IEDM) > 4.3.1 - 4.3.4
2013 IEEE International Reliability Physics Symposium (IRPS) > ER.2.1 - ER.2.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.4.1 - 5D.4.6
2013 Spanish Conference on Electron Devices > 281 - 284
IEEE Electron Device Letters > 2010 > 31 > 6 > 543 - 545
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430