Search results for: Siyang Liu
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 780 - 784
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3275 - 3281
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 634 - 637
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4331 - 4338
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1644 - 1649
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3767 - 3773
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 458 - 460
IEEE Electron Device Letters > 2014 > 35 > 7 > 690 - 692
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 229 - 233
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3632 - 3638
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 161 - 166
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1158 - 1163