Search results for: Anjan Rakshit
Expert Systems > 38 > 3 > n/a - n/a
IEEE Instrumentation & Measurement Magazine > 2016 > 19 > 2 > 13 - 19
ISA Transactions > 2015 > 58 > C > 50-57
IEEE Transactions on Instrumentation and Measurement > 2015 > 64 > 4 > 959 - 966
Applied Soft Computing > 2014 > 25 > Complete > 40-50
International Journal of Robust and Nonlinear Control > 24 > 5 > 902 - 917
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 9 > 2180 - 2187
Machine Vision and Applications > 2014 > 25 > 2 > 405-419
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 6 > 1605 - 1612
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 7 > 1908 - 1914
Measurement > 2012 > 45 > 1 > 59-67
Expert Systems With Applications > 2011 > 38 > 7 > 8266-8274
Measurement > 2011 > 44 > 4 > 620-641
IEEE Sensors Journal > 2011 > 11 > 4 > 1033 - 1034
IEEE Transactions on Instrumentation and Measurement > 2011 > 60 > 9 > 3120 - 3127
Measurement > 2006 > 39 > 10 > 884-891