Search results for: Yi Shao
Microelectronics Reliability > 2015 > 55 > 11 > 2331-2335
Journal of Electronic Materials > 2012 > 41 > 12 > 3368-3374
IEEE Transactions on Advanced Packaging > 2009 > 32 > 3 > 627 - 635
Microelectronics Reliability > 2015 > 55 > 11 > 2331-2335
Journal of Electronic Materials > 2012 > 41 > 12 > 3368-3374
IEEE Transactions on Advanced Packaging > 2009 > 32 > 3 > 627 - 635