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Recent advances in silicon photonics bring significant benefits to "macrochip" grids made of arrayed chips. Such configurations have global interconnects long enough to benefit from the high speed, low energy, and high bandwidth density of optics. In this paper we consider the constraints of large macrochip systems, and explore modulator drivers and photodetector receivers that match those...
A reliability evaluation of a 300-mm-compatible 3DI process is presented. The structure has tungsten through-Si-vias (TSVs), a hybrid Cu/adhesive bonding interface, and a post Si-thinning Cu BEOL. The interface bonding strength, deep thermal cycles test, temperature and humidity test, and ambient permeation oxidation all show favorable results, indicating the suitability of this technology for VLSI...
Electromigration (EM) and self-heating are critical reliability concerns for metal wires in high performance designs. EM reliability rules for a VLSI technology are typically expressed in terms of average, root-mean-square and peak current limits for each metal layer in the technology. To ensure EM reliability of a design, current flowing through each wire segment in the design should not violate...
The dynamic behavior of a VLSI circuit can be described by a system of differential-algebraic equations. When some circuit elements are affected by process variations, the dynamic behavior of the circuit will deviate from its nominal trajectory. Monte-Carlo-type random sampling methods are widely used to estimate the trajectory deviation. However they can be quite time-consuming when the dimension...
Many characteristics of VLSI designs, such as process variations, demonstrate strong spatial correlations. Accurately modeling of these correlated behaviors is crucial for many timing and power analyses to be valid. This paper proposes a new spatial model with a long-range trend component, a smooth correlation component, as well as a truly random component. The efficient method to construct such a...
The clock distribution network is a key component on any synchronous VLSI design. As technology moves into the nanometer era, innovative clocking techniques are required to solve the power dissipation and variability issues. Rotary clocking is a novel technique which employs unterminated rings formed by differential transmission lines to save power and reduce skew variability. Despite its appealing...
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