Search results for: Y. Hou
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4071 - 4077
2010 International Electron Devices Meeting > 2.1.1 - 2.1.4
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4071 - 4077
2010 International Electron Devices Meeting > 2.1.1 - 2.1.4