Search results for: R. Liu
IEEE Electron Device Letters > 2010 > 31 > 2 > 126 - 128
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Electron Device Letters > 2010 > 31 > 2 > 126 - 128
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351