Search results for: R. Liu
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2229 - 2237
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2229 - 2237