Search results for: R. Liu
IEEE Electron Device Letters > 2009 > 30 > 4 > 380 - 382
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351
IEEE Electron Device Letters > 2009 > 30 > 4 > 380 - 382
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 344 - 351