Search results for: Chun Wang
Microelectronics Reliability > 2015 > 55 > 11 > 2203-2207
IET Power Electronics > 2015 > 8 > 7 > 1156 - 1163
Microelectronic Engineering > 2015 > 138 > Complete > 97-101
IEEE Transactions on Plasma Science > 2014 > 42 > 12-1 > 3747 - 3750
IEEE Transactions on Plasma Science > 2014 > 42 > 12-1 > 3712 - 3715
IEEE Transactions on Plasma Science > 2014 > 42 > 12-1 > 3703 - 3705
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 551 - 556
Nanoscale Research Letters > 2012 > 7 > 1 > 1-5
IEEE Electron Device Letters > 2011 > 32 > 5 > 584 - 586
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 895 - 900
IEEE Transactions on Microwave Theory and Techniques > 2010 > 58 > 9 > 2319 - 2325