Search results for: Tae-Hyoung Kim
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2177 - 2185
IEEE Micro > 2014 > 34 > 6 > 74 - 85
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
2008 IEEE Custom Integrated Circuits Conference > 407 - 410