Wyniki wyszukiwania dla: H. S. Gamble
NATO Science Series II: Mathematics, Physics and Chemistry > Science and Technology of Semiconductor-On-Insulator Structures and Devices Operating in a Harsh Environment > SOI Material Technologies > 103-108
Journal of Materials Science: Materials in Electronics > 2016 > 27 > 6 > 6292-6304
Journal of Raman Spectroscopy > 43 > 3 > 448 - 454
Journal of Materials Science: Materials in Electronics > 2008 > 19 > 2 > 119-123
Journal of Materials Science: Materials in Electronics > 2005 > 16 > 7 > 437-443
Journal of Materials Science: Materials in Electronics > 2005 > 16 > 7 > 387-392
Journal of Materials Science: Materials in Electronics > 2005 > 16 > 4 > 233-238
Journal of Materials Science: Materials in Electronics > 2003 > 14 > 5-7 > 329-332
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 347-350
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 215-218
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 303-306
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 307-312
Journal of Materials Science: Materials in Electronics > 2001 > 12 > 4-6 > 327-331
Microelectronics Reliability > 1996 > 36 > 3 > 446-447