Search results for: A. Hikavyy
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
2016 IEEE International Electron Devices Meeting (IEDM) > 19.7.1 - 19.7.4
2013 IEEE International Electron Devices Meeting > 4.2.1 - 4.2.4
2013 IEEE International Electron Devices Meeting > 20.4.1 - 20.4.4
2012 International Electron Devices Meeting > 6.5.1 - 6.5.4
2012 International Electron Devices Meeting > 25.3.1 - 25.3.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.10
2010 International Electron Devices Meeting > 10.4.1 - 10.4.4
2010 International Electron Devices Meeting > 10.6.1 - 10.6.4