Search results for: Helene Fremont
Microelectronics Reliability > 2017 > 76-77 > C > 362-367
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 443 - 457
Microelectronics Reliability > 2015 > 55 > 9-10 > 1849-1854
Microelectronics Reliability > 2014 > 54 > 9-10 > 2013-2016
2013 24th EAEEIE Annual Conference (EAEEIE 2013) > 121 - 127
Microelectronics Reliability > 2012 > 52 > 9-10 > 2278-2282