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Conventional near-field scanning techniques often employ a general setup such as: broadband near-field probe output connected to a chain of amplifiers through a coaxial cable to a spectrum analyzer. In this paper, we investigated how the signal to noise ratio is influenced by the coaxial connection between the probe output and the first amplifier, types of probes, cooling the probes with liquid nitrogen...
Correlation between near-field EMI scan and ESD susceptibility scan of a cellphone CPU IC is investigated. It is shown that the ESD susceptibility of the CPU IC depends on the activity of the IC. Based on the obtained correlation between these two scans, it is sufficient to perform the ESD susceptibility scan only by running the application which highly loads the CPU. This reduces the ESD susceptibility...
In this paper, absorber material is utilized to mitigate an EMI problem in real hardware. For a complex and large system, identification of the source location is the first problem which must be solved to achieve electromagnetic interference (EMI) mitigation. Emission Source Microscopy (ESM) provides a powerful tool for locating the sources of radiation in GHz range on a printed circuit board (PCB)...
The objective of this paper is to present a methodology for identifying the current flow in the capacitors of a multiphase buck converter by synchronously measuring the capacitor currents. A multiphase buck converter uses multiple parallel buck converters with different switching times to source a large amount of current. Currents in the primary capacitors of a multiphase buck converter are drawn...
Compared to scanning by hand, traditional robotic scanning to measure or to inject EM near field has advantages and disadvantages. It can scan large area with excellent resolution. However, it is difficult to program the experience of engineers into the robotic system for selecting scan areas, and complex shaped objects are nearly impossible to scan automatically. A CMM (Coordinate Measuring Machine)...
Only highly sensitive probe systems can detect the weak field strengths that cause radio-frequency-interference (RFI) problems typically found within cell phones. The sensitivity of the probe systems depends on the probe factor and on the noise floor. The effect of cooling by liquid nitrogen on the received signal strength and the noise floor of three resonant probe systems has been investigated....
Near-field scan on a Huygens' box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens' box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that...
Resonances degrade the product's EMI or immunity performance at resonance frequencies. Near field scanning techniques, like EMI scanning or susceptibility scanning determine the local behaviour, but fail to connect the local behaviour to the system level behaviour. Resonating structures form part of the coupling paths, i.e., identifying them will aid in understanding system level behaviour of products...
IC switching current is the main noise source of many power integrity issues in printed circuit boards. Accurate measurement of the current waveforms is critical for an effective power distribution network design. In this paper, using a giant magnetoimpedance (GMI) probe for this purpose is studied. A side-band detection and demodulation system is built up to measure various time-domain waveforms...
Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced...
Previously a measurement technique for ESD current spreading on a PCB using near field scanning was developed in order to connect the local ESD sensitivity to system level ESD failures in time and spatial domain. The concept of such scanning methodology is proved and several scanning results were processed. However the validation, precision and weakness of such methodology need to be further investigated...
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