Search results for: Linda Milor
Microelectronics Reliability > 2017 > 76-77 > C > 47-52
Microelectronics Reliability > 2017 > 76-77 > C > 81-86
Microelectronics Reliability > 2017 > 76-77 > C > 87-91
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2271 - 2284
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 7 > 2045 - 2058
2017 IEEE International Reliability Physics Symposium (IRPS) > RT-1.1 - RT-1.6
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2712 - 2725
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 7 > 2521 - 2534
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 6 > 2184 - 2194
Microprocessors and Microsystems > 2015 > 39 > 8 > 950-960
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 10 > 2065 - 2076
Microelectronics Reliability > 2015 > 55 > 9-10 > 1334-1340
Microelectronics Reliability > 2015 > 55 > 9-10 > 1290-1296