Search results for: Taizhi Liu
Microelectronics Reliability > 2017 > 76-77 > C > 81-86
Microelectronics Reliability > 2017 > 76-77 > C > 87-91
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2271 - 2284
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2712 - 2725
Microprocessors and Microsystems > 2015 > 39 > 8 > 950-960
Microelectronics Reliability > 2015 > 55 > 9-10 > 1404-1411
Microelectronics Reliability > 2015 > 55 > 9-10 > 1334-1340
Microelectronics Reliability > 2015 > 55 > 9-10 > 1290-1296
2014 IEEE International Reliability Physics Symposium > CA.8.1 - CA.8.9