Search results for: P. Olivo
Microelectronic Engineering > 2017 > 178 > C > 1-4
IEEE Electron Device Letters > 2017 > 38 > 2 > 175 - 178
2016 IEEE International Electron Devices Meeting (IEDM) > 4.7.1 - 4.7.4
Inside NAND Flash Memories > 89-113
2013 IEEE International Reliability Physics Symposium (IRPS) > 2E.3.1 - 2E.3.7
Microelectronics Reliability > 2012 > 52 > 6 > 1060-1064
2011 International Reliability Physics Symposium > 2G.2.1 - 2G.2.6
2011 International Reliability Physics Symposium > MY.4.1 - MY.4.5
Solid State Electronics > 2011 > 58 > 1 > 23-27
IEEE Electron Device Letters > 2010 > 31 > 3 > 198 - 200
Nuclear Inst. and Methods in Physics Research, B > 2009 > 267 > 16 > 2592-2595
Bulletin of the Russian Academy of Sciences: Physics > 2009 > 73 > 6 > 835-839