Search results for: P. Godignon
IEEE Transactions on Industrial Electronics > 2011 > 58 > 7 > 2582 - 2590
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 557 - 562
CAS 2005 Proceedings. 2005 International Semiconductor Conference, 2005. > 2 > 361 - 364 vol. 2