Search results for: Takuya Hoshii
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 456 - 462
Microelectronic Engineering > 2011 > 88 > 7 > 1087-1090
Journal of Crystal Growth > 2010 > 312 > 8 > 1348-1352
Journal of Crystal Growth > 2008 > 310 > 23 > 4768-4771