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High-resolution computer-controlled oscillator of 2-mm wave-range intended for the low temperature dielectrometer was designed and constructed. The proposed oscillator unit may be used as free-running source as well as phase locked source being included to the frequency synthesis system. Dependence of dielectric loss vs temperature for some diamond-like materials was measured using proposed oscillator...
The description of the precision temperature measurement unit for measuring temperature of the investigated samples in the low-temperature dielectrometer in the range of 0.3 − 300 K with an accuracy of 0.05 K is given. Four-wire measurement circuit on an alternating current with use of the semiconductor temperature sensor (semiconductor film resistance thermometer) in the whole temperature range is...
The paper presents the results of experimental investigation of the temperature dependence of dielectric losses of a number of high-resistance semiconductor materials at frequencies 110 – 144 GHz and 280 GHz in the temperature range 1 – 300 K by using the technique of the disk dielectric resonator with whispering gallery modes. Dielectric loss tangent of some materials is less than 10−5. Dielectric...
The paper presents the study results of the temperature dependence of the dielectric loss at millimeter waves in the temperature range of 1.0 ??? 300 K in some low-absorbing dielectric and semiconductor materials having the diamond-like crystal lattices. It is shown that the absorption maxima at helium temperatures in materials with a centrosymmetric lattice are primary associated with both intrinsic...
To meet requirements, which arise while design of equipment for research the dielectric parameters of low-loss materials in the millimeter waveband, the necessity of high-precision temperature stabilization and measurement appear. Despite the fact that a lot of attention [1,2] is devoted to this task already, it reminds still actual, due to a plenty of specific features, which each given measuring...
The technique for determination of dielectric parameters of substances is submitted on a base of using a high-Q “whispering gallery” oscillations in a quasi-optical spherical resonator. The function ability of a method is shown on an example of measurement of permittivity for several substances in the 8 mm wave band.
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