Search results for: Partha Bhattacharyya
Microsystem Technologies > 2019 > 25 > 5 > 1937-1944
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 738 - 745
CSI Transactions on ICT > 2018 > 6 > 1 > 71-76
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4738 - 4745
IEEE Transactions on Nanotechnology > 2017 > 16 > 6 > 1122 - 1128
IEEE Transactions on Nanotechnology > 2017 > 16 > 5 > 820 - 825
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2357 - 2363
IEEE Transactions on Nanotechnology > 2017 > 16 > 2 > 180 - 188
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4933 - 4938
IEEE Electron Device Letters > 2016 > 37 > 5 > 656 - 659
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1266 - 1273
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 10 > 2001 - 2008
IEEE Sensors Journal > 2015 > 15 > 10 > 5919 - 5926
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 376 - 383
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1984 - 1990
IEEE Electron Device Letters > 2015 > 36 > 5 > 505 - 507
IEEE Sensors Journal > 2015 > 15 > 1 > 408 - 416