Search results for: T. Chiarella
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-11.1 - XT-11.6
2016 IEEE International Electron Devices Meeting (IEDM) > 15.3.1 - 15.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1084 - 1087
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Physics of Modern SemOI Devices > 141-153
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
2015 IEEE International Electron Devices Meeting (IEDM) > 14.1.1 - 14.1.4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.6.1 - 11.6.4
2015 IEEE International Reliability Physics Symposium > 3B.5.1 - 3B.5.6
2015 IEEE International Reliability Physics Symposium > 3B.4.1 - 3B.4.8
2013 IEEE International Electron Devices Meeting > 20.6.1 - 20.6.4
2013 IEEE International Electron Devices Meeting > 17.3.1 - 17.3.3
Solid State Electronics > 2013 > 87 > Complete > 11-16