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Over the past years, the adaptation of flash memory has seen a tremendous growth in a wide range of fields, with high-end applications demanding ever higher reliability and performance for storage devices. Even though a single-level-cell (SLC) flash memory can have a higher endurance and a lower access latency to better meet that requirement in comparison with a multi-level-cell (MLC) one, the rapid...
Even though 3D flash memory presents a grand opportunity to huge-capacity non-volatile memory, it suffers from serious program disturbance problems. In contrast to the past efforts in error correction codes and the work in trading the space utilization for reliability, we propose a disturbance-relaxation scheme that can alleviate the negative effects caused by program disturbance inside a physical...
Solid state drives (SSDs) that deliver high- bandwidth and low-latency performance have become the mainstream of storage devices in modern systems. Over the past years, there has been a great deal of researches conducted to improve the SSD performance or reliability with parallel or efficient address translation designs. On the contrary, little work is done for the optimization to guarantee the booting/recovery...
With the rapidly-increasing capacity demand over flash memory, 3D NAND flash memory has drawn tremendous attention as a promising solution to further reduce the bit cost and to increase the bit density. However, such advanced 3D devices will suffer more intensive program disturbance, compared to 2D NAND flash memory. Especially when multi-level-cell (MLC) technology is adopted, the deteriorated disturbance...
We introduce a novel programming algorithm that is particularly suitable for 3D NAND. With larger design rules and charge trapping (CT) device 3D NAND is much less sensitive to interference therefore should not use elaborate and costly algorithms designed for scaled 2D NAND. By binary division of cell Vt into smaller groups the number of verification pulses can be reduced. For MLC/TLC which requires...
Although the Multi-Level-Cell technique is widely adopted by flash-memory vendors to boost the chip density and to lower the cost, it results in serious performance and reliability problems. Different from the past work, a new cell programming method is proposed to not only significantly improve the chip performance but also reduce the potential bit error rate. In particular, a Single-Level-Cell-like...
Even though 3D flash memory presents a grand opportunity for huge-capacity non-volatile memory, it suffers from serious program disturb problems. Different from the past efforts in error correction codes or the work in trading the space utilization with reliability, we propose a disturb-alleviation scheme that can alleviate the negative effects caused by program disturb, especially inside a block,...
Multi-level cell (MLC) programming is of crucial importance to make a cost competitive NAND Flash product. In conventional 2D floating gate NAND Flash, the interference and disturb become very severe as technology scales, and many methods have been adopted to alleviate the interferences. In 3D NAND, the pitch is generally larger and the charge-trapping device naturally has smaller interference. However,...
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