Search results for: Marleen Van Hove
IEEE Electron Device Letters > 2017 > 38 > 7 > 918 - 921
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-2-1 - 4A-2-6
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Electron Device Letters > 2015 > 36 > 10 > 1001 - 1003
2015 IEEE International Reliability Physics Symposium > 6C.4.1 - 6C.4.6
physica status solidi c > 11 > 3‐4 > 450 - 453
IEEE Transactions on Power Electronics > 2014 > 29 > 5 > 2199 - 2207
IEEE Electron Device Letters > 2014 > 35 > 10 > 1004 - 1006
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2712 - 2719
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3071 - 3078
IEEE Electron Device Letters > 2012 > 33 > 5 > 667 - 669
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 589 - 598
IEEE Electron Device Letters > 2011 > 32 > 1 > 30 - 32
IEEE Electron Device Letters > 2011 > 32 > 10 > 1370 - 1372