Search results for: E. X. Zhang
IEEE Electron Device Letters > 2017 > 38 > 12 > 1724 - 1727
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 512 - 518
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 471 - 476
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 170 - 175
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 204 - 211
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2098 - 2106
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2122 - 2128
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 285 - 292
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 3064 - 3071
2015 IEEE International Reliability Physics Symposium > 2E.3.1 - 2E.3.6
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3163 - 3170
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3037 - 3042
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2951 - 2958